The Institute of Materials Science of Seville (ICMS) has opened the registration period for the course ‘Physical methods of thin film and surface analysis of solids’. Registration for this CSIC postgraduate course, directed by Doctors Juan Pedro Espinós and Guillermo Munuera, will be open until 15 June 2011. The aim of the course is to familiarise participants with some of the most commonly used physical methods of analysis for the characterisation of materials in general, and of thin layers and surfaces in particular.

These academic sessions will be held intensively from 27 June to 1 July at the CicCartuja facilities. Divided into theoretical and practical sessions, this course deals with different topics such as the technological applications of thin films, film and coating preparation techniques, emission spectroscopy systems and X-ray diffraction and absorption. In addition, the practical classes, carried out with small groups of students, will attempt to introduce students to the specific techniques used with the scientific equipment available at the Materials Science Institute of Seville, the National Accelerator Centre and the Photoelectron Spectroscopy Service of the University of Seville.

Information and registration for the course ‘Physical methods of thin film and surface analysis of solids’ at the following link:

http://www.icmse.csic.es/index.php?module=Pagesetter&func=viewpub&tid=2&pid=0