Services

CICCARTUJA

 Transmission electron microscopy

Description of the service

The service performs electron microscopy in transmission mode: brightfield and darkfield imaging, selected area electron diffraction and high resolution electron microscopy.

It can work on electron-transparent samples prepared ad-hoc for this purpose. It provides two-dimensional images of sample texture, grain and/or particle shape and size, degree of homogeneity at the microscopic scale, degree of sample crystallinity, identification of crystalline phases, and high-resolution images identifying crystalline domains.

It also provides EDX elemental analysis. The service does not have certifications or accreditations. It has a Philips CM20 200 kV TEM equipment equipped with a CCD camera and an EDX SDD X-Max 80T detector (Oxford Instruments). It does not have STEM mode. It has a resolution of 0.14 nm between lines and 0.23 nm between points.

More information on the service website.

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