From June 28 to July 2, the cicCartuja will host the specialization course in materials science and technology “Physical methods of thin film and surface analysis of solids”, organized by the ICMS and directed by Dr. Juan Pedro Espinós and Dr. Guillermo Munuera. Framed in the postgraduate courses of the CSIC, these conferences are proposed as an academic alternative to familiarize students with some of the most widely used methods of analysis currently used for the characterization of materials in general, and of surfaces and thin layers in particular.

Divided into theoretical and practical sessions, this course will address diverse topics such as the technological applications of thin films, film and coating preparation techniques, emission spectroscopy systems and X-ray diffraction and absorption. In addition, the practical classes will attempt to introduce students to the specific techniques used with the equipment of the Materials Science Institute of Seville, the National Accelerator Center and the Photoelectron Spectroscopy Service of the University of Seville.